Wikipedia

Built-in test equipment

Also found in: Acronyms.

Built-in test equipment (BITE) primarily refers to passive fault management and diagnosis equipment built into airborne systems to support maintenance processes.[1] Built-in test equipment includes multimeters, oscilloscopes, discharge probes, and frequency generators that are provided as part of the system to enable testing and perform diagnostics.

The acronym BIT is often used for this same function or, more specifically, in reference to the individual tests.

BIT often includes:

  • The detection of the fault
  • The accommodation of the fault (how the system actively responds to the fault)
  • The annunciation or logging of the fault to warn of possible effects and/or aid in troubleshooting the faulty equipment.

Functionality

  • Analysis of failure monitoring results
  • Reporting and memorization of failures
  • Management of tests

See also

References

  1. ^ "Glossary of Defense Acquisition Acronyms and Terms". Archived from the original on 2013-03-13. Retrieved 2014-06-28.


This article is copied from an article on Wikipedia® - the free encyclopedia created and edited by its online user community. The text was not checked or edited by anyone on our staff. Although the vast majority of Wikipedia® encyclopedia articles provide accurate and timely information, please do not assume the accuracy of any particular article. This article is distributed under the terms of GNU Free Documentation License.

Copyright © 2003-2025 Farlex, Inc Disclaimer
All content on this website, including dictionary, thesaurus, literature, geography, and other reference data is for informational purposes only. This information should not be considered complete, up to date, and is not intended to be used in place of a visit, consultation, or advice of a legal, medical, or any other professional.